Nanometrology

Nanometrology is a subfield of metrology, concerned with the explànation of measurement at the nanoscale level. Nanometrology has a critical part keeping in mind the end goal to deliver nanomaterials and gadgets with a high level of precision and dependability in nanomanufacturing. A test in this field is to create or make new estimation strategies and measures to address the issues of cutting edge propelled producing, which will depend on nanometer scale materials and advancements. The requirements for estimation and portrayal of new example structures and attributes far surpass the abilities of current estimation science. Expected advances in rising U.S. nanotechnology commercial enterprises will require progressive metrology with higher determination and exactness than has previously been imagined.

  • Thin films and Nanocoatings
  • Modeling and simulations for nanometrology
  • Traceability in nanoscale metrology
  • Society and regulation issues

Related Conference of Nanometrology

April 25-26, 2024

36th Nano Congress for Future Advancements

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27th World Nanotechnology Congress

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11th Global Conference on Smart Materials and Nanotechnology

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10th Annual Meet on Nanoscience and Nanotechnology

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Nanometrology Conference Speakers

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